Read timing generation circuit
- 申请号:US201114123104
- 专利类型:US
- 申请(专利权)人:中国科学院微电子研究所
- 公开(公开)号:US9047935(B2)
- 公开(公开)日:2015.06.02
- 法律状态:
- 出售价格: 面议 立即咨询
专利详情
专利名称 | Read timing generation circuit | ||
申请号 | US201114123104 | 专利类型 | US |
公开(公告)号 | US9047935(B2) | 公开(授权)日 | 2015.06.02 |
申请(专利权)人 | 中国科学院微电子研究所 | 发明(设计)人 | Chen Weiwei;Chen Lan;Yang Shiyang |
主分类号 | G11C7/00 | IPC主分类号 | G11C7/00;G11C7/22;G11C8/18;G11C8/06;G11C7/12 |
专利有效期 | Read timing generation circuit 至Read timing generation circuit | 法律状态 | |
说明书摘要 | Disclosed is a read timing generation circuit, capable of reducing dynamic power consumption. After a multi-bit address Add1, Add2, . . . , and AddN passes through an address change monitoring unit (100), a response pulse signal corresponding the address is generated. After the response pulse signal passes through an address trigger determination unit (200), a single trigger determination signal ATDPRE is generated. The single trigger determination signal ATDPRE passes through an ATD timing generation unit (300) and a post-timing generation unit (1000), thereby forming a read timing generation circuit in a serial link and generating corresponding read timing. Compared with the conventional read timing generation circuit in which each bit of an address signal corresponds to a stage of structures to execute the trigger, ATD control timing output, and ATD determination process separately, the present invention greatly reduces the total dynamic power consumption of the circuit. |
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