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Read timing generation circuit

  • 申请号:US201114123104
  • 专利类型:US
  • 申请(专利权)人:中国科学院微电子研究所
  • 公开(公开)号:US9047935(B2)
  • 公开(公开)日:2015.06.02
  • 法律状态:
  • 出售价格: 面议
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专利详情

专利名称 Read timing generation circuit
申请号 US201114123104 专利类型 US
公开(公告)号 US9047935(B2) 公开(授权)日 2015.06.02
申请(专利权)人 中国科学院微电子研究所 发明(设计)人 Chen Weiwei;Chen Lan;Yang Shiyang
主分类号 G11C7/00 IPC主分类号 G11C7/00;G11C7/22;G11C8/18;G11C8/06;G11C7/12
专利有效期 Read timing generation circuit 至Read timing generation circuit 法律状态
说明书摘要 Disclosed is a read timing generation circuit, capable of reducing dynamic power consumption. After a multi-bit address Add1, Add2, . . . , and AddN passes through an address change monitoring unit (100), a response pulse signal corresponding the address is generated. After the response pulse signal passes through an address trigger determination unit (200), a single trigger determination signal ATDPRE is generated. The single trigger determination signal ATDPRE passes through an ATD timing generation unit (300) and a post-timing generation unit (1000), thereby forming a read timing generation circuit in a serial link and generating corresponding read timing. Compared with the conventional read timing generation circuit in which each bit of an address signal corresponds to a stage of structures to execute the trigger, ATD control timing output, and ATD determination process separately, the present invention greatly reduces the total dynamic power consumption of the circuit.

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