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Multi-functional online testing system for semiconductor light-emitting devices or modules and method thereof

  • 申请号:US201314056389
  • 专利类型:US
  • 申请(专利权)人:中国科学院半导体研究所
  • 公开(公开)号:US9091721(B2)
  • 公开(公开)日:2015.07.28
  • 法律状态:
  • 出售价格: 面议
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专利详情

专利名称 Multi-functional online testing system for semiconductor light-emitting devices or modules and method thereof
申请号 US201314056389 专利类型 US
公开(公告)号 US9091721(B2) 公开(授权)日 2015.07.28
申请(专利权)人 中国科学院半导体研究所 发明(设计)人 Zhao Lixia;Zhou Zichao;Yang Hua;Wang Junxi;Li Jinmin
主分类号 G01R31/00 IPC主分类号 G01R31/00;G01R31/26
专利有效期 Multi-functional online testing system for semiconductor light-emitting devices or modules and method thereof 至Multi-functional online testing system for semiconductor light-emitting devices or modules and method thereof 法律状态
说明书摘要 The disclosure provides a system and method for multi-functional online testing of semiconductor light-emitting devices or modules. The system includes an electrical characteristic generating and testing equipment, one or more optical characteristic detecting and controlling equipments, an optical signal processing and analyzing equipment, one or more thermal characteristic detecting equipments, a central monitoring and processing computer, a multi-channel integrated drive controlling equipment, one or more multi-stress accelerated degradation controlling equipments, and one or more load boards. The present disclosure enables in-situ online monitoring and testing under accelerated degradation in a multi-stress accelerated degradation environment.

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