专利详情

专利名称	Low dose single step grating based X-ray phase contrast imaging
申请号	US201013148198	专利类型	US
公开（公告）号	US8972191(B2)	公开（授权）日	2015.03.03
申请（专利权）人	中国科学院高能物理研究所	发明（设计）人	Stampanoni Marco;Wu Ziyu;Zhu Peiping
主分类号	G01B9/02	IPC主分类号	G01B9/02;G01N21/31;G06F3/00;G06F3/01;G01N23/04;A61B6/00
专利有效期	Low dose single step grating based X-ray phase contrast imaging 至Low dose single step grating based X-ray phase contrast imaging	法律状态
说明书摘要	Phase sensitive X-ray imaging methods provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems impairing the wider use of phase contrast in X-ray radiography and tomography. To separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed “reverse projection” is the significantly reduced delivered dose, without degradation of the image quality.